ATOMIC AND MICROSTRUCTURAL CHARACTERIZATION OF METAL IMPURITIES IN SYNTHETIC DIAMONDS

被引：11

作者：

WONG, J

KOCH, EF

HEJNA, CI

GARBAUSKAS, MF

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 58卷 / 09期

关键词：

D O I：

10.1063/1.335755

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：3388 / 3393

页数：6

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