USE OF A FAST ATOM BEAM IN ION MICROSCOPY (FABIM) FOR ANALYSIS OF POORLY CONDUCTING MATERIALS

被引：17

作者：

DEGREVE, F

LANG, JM

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1985年 / 7卷 / 04期

关键词：

D O I：

10.1002/sia.740070405

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：177 / 187

页数：11

相关论文

共 12 条

[1] BARBER M, 1981, J CHEM SOC CHEM COMM, P345
[2] BERNHEIM M, 1973, THESIS U PARIS SUD C
[3] ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS
BRIGGS, D
WOOTTON, AB
[J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) : 109 - 115
[4] ANALYSIS OF POLYMER SURFACES BY SIMS .3. PRELIMINARY-RESULTS FROM MOLECULAR IMAGING AND MICROANALYSIS EXPERIMENTS
BRIGGS, D
[J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (03) : 113 - 118
[5] BROCHARDT G, 1981, MIKROCHIM ACTA, V2, P421
[6] STATIC SIMS FOR APPLIED SURFACE-ANALYSIS
BROWN, A
VICKERMAN, JC
[J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (01) : 1 - 14
[7] CHAINTREAU M, UNPUB J MICROSC SPEC
[8] DEVIENNE FM, 1973, CRAS PARIS, P276
[9] GOURGOUT JM, 1979, SIMS, V2, P286
[10] SUPPRESSION OF MOLECULAR-IONS IN THE SECONDARY ION MASS-SPECTRA OF MINERALS
METSON, JB
BANCROFT, GM
MCINTYRE, NS
CHAUVIN, WJ
[J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) : 181 - 185