MONTE-CARLO SIMULATION OF X-RAY-ABSORPTION AND ELECTRON-DRIFT IN GASEOUS XENON

A detailed Monte Carlo simulation model has been developed to study the absorption of soft x rays and the subsequent behavior of the resulting electrons under the influence of an applied electric field in gaseous xenon. All relevant physical processes are included from the initial photoionization through the subsequent decay of the residual ion to the scattering and drift of the electrons resulting from the interactions with the background gas. Details are provided for the cross sections and decay rates employed as well as the criteria used to terminate the simulation, depending on the information or results required. Examples of its use in modeling gaseous radiation detectors are included.