LATTICE IMAGE OBSERVATION OF EXTENDED DISLOCATIONS IN CDS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：6

作者：

SUZUKI, K ^{[1
]}

TAKEUCHI, S ^{[1
]}

KANAYA, K ^{[1
]}

机构：

[1] KOGAKUIN UNIV,SHINJUKU KU,TOKYO 160,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1982年 / 21卷 / 10期

关键词：

D O I：

10.1143/JJAP.21.L621

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L621 / L623

页数：3

共 13 条

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[8] PLASTIC-DEFORMATION OF CDTE SINGLE-CRYSTALS .1. MICROSCOPIC OBSERVATIONS [J].

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[9] HVEM STRUCTURE IMAGES OF EXTENDED 60-DEGREES-DISLOCATION AND SCREW-DISLOCATION IN SILICON [J].

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[10]

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