INTERFEROMETRIC EFFECT WITH SEMICONDUCTORS IN MILLIMETER-WAVE REGION

被引：17

作者：

JACOBS, H

MORRIS, G

HOFER, RC

机构：

来源：

关键词：

D O I：

10.1364/JOSA.57.000993

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：993 / &

共 3 条

[1] PROPOSAL FOR FOG PENETRATING IMAGING DEVICE [J].

JACOBS, H ;

HOFER, RC ;

MORRIS, G .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (06) :907-&

[2] SEMICONDUCTOR REFLECTION TYPE MICROWAVE MODULATOR [J].

JACOBS, H ;

BENJAMIN, RW ;

HOLMES, DA .

[3] ELECTRONIC SCANNING SYSTEM FOR INFRARED IMAGING [J].

LASSER, ME ;

CHOLET, PH ;

EMMONS, RB .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1959, 47 (12) :2069-2075