SIMPLE MULTIPLE-CRYSTAL X-RAY SPECTROGRAPH

被引：1

作者：

NAGEL, DJ

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1983年 / 54卷 / 12期

关键词：

D O I：

10.1063/1.1137343

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1797 / 1798

页数：2

共 18 条

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[4]

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[7]

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[8] WAVELENGTH CALIBRATION OF FLAT-CRYSTAL AND CONVEX CURVED-CRYSTAL X-RAY SPECTROGRAPHS [J].

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APPLIED SPECTROSCOPY, 1979, 33 (01) :19-25

[9] SENSITIVITY OF X-RAY FILM .2. KODAK NO-SCREEN FILM IN 1-100-KEV REGION [J].

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[10]

GILFRICH JV, 1975, APPL SPECTROSC, V29, P322, DOI 10.1366/000370275774455914

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