VALENCE BAND-STRUCTURE OF CUINS2 BY SOFT-X-RAY SPECTROSCOPY

被引：13

作者：

CRISP, RS ^{[1
]}

HANEMAN, D ^{[1
]}

CHU, JW ^{[1
]}

机构：

[1] UNIV NEW S WALES,SCH PHYS,KENSINGTON,NSW 2033,AUSTRALIA

来源：

SOLID STATE COMMUNICATIONS | 1992年 / 83卷 / 12期

关键词：

D O I：

10.1016/0038-1098(92)90535-H

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Soft X-ray emission spectra have been used to examine the s, p and d contributions to the valence band density of states (DOS) in CuInS2. The results for the positions and widths of these components are compared with theory, with X-ray photoelectron spectroscopy (XPS) data and with our earlier measurements on the analogous material CuInSe2. We find the d contribution to peak at -5.5 eV with respect to the Fermi level, the s contribution at -4.0 eV and a total bandwidth of 8.5 +/- 1.0 eV in reasonable agreement theory.

引用

页码：1035 / 1038

页数：4

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