(ELECTRO)MECHANICAL CHARACTERISTICS OF ELECTROSTATICALLY DRIVEN VACUUM ENCAPSULATED POLYSILICON RESONATORS

被引:8
作者
TILMANS, HAC
LEGTENBERG, R
SCHURER, H
IJNTEMA, DJ
ELWENSPOEK, M
FLUITMAN, JHJ
机构
[1] MESA Research Institute, University of Twente
关键词
D O I
10.1109/58.265813
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
The design, fabrication and performance of vacuum-encapsulated electrostatically driven polysilicon resonating beams, 210-510 mum long, 100 mum wide, and 1.5 mum thick, are described. The shortest beams have a fundamental frequency of 324 kHz, a gauge factor of 2400 and a quality factor of 600 at cavity pressures of 0.15 mbar. Intrinsic quality factors of 18 000 were measured below 0.01 mbar.
引用
收藏
页码:4 / 6
页数:3
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