A CONFOCAL BEAM SCANNING WHITE-LIGHT MICROSCOPE

被引:9
作者
HELL, S
WITTING, S
VONSCHICKFUS, M
VANRESANDT, RWW
HUNKLINGER, S
SMOLKA, E
NEIGER, M
机构
[1] LEICA LASERTECH GMBH,HEIDELBERG,GERMANY
[2] UNIV KARLSRUHE,INST LICHTTECH,W-7500 KARLSRUHE,GERMANY
来源
JOURNAL OF MICROSCOPY-OXFORD | 1991年 / 163卷
关键词
CONFOCAL MICROSCOPY; BEAM SCANNING; WHITE-LIGHT ILLUMINATION; VERTICAL AND LATERAL RESOLUTION; COHERENCE LENGTH; INTERFERENCE;
D O I
10.1111/j.1365-2818.1991.tb03170.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
We report on a confocal beam scanning microscope utilizing a continuous Xe short-arc lamp operating in the visible spectrum with unprecedented radiance. Measurements of lateral and vertical resolution will be presented and compared with those of an equivalent scanning laser microscope. Resolution of the white-light microscope is equivalent to that of the scanning laser microscope. White-light microscope images positively stand out from those of the scanning laser microscope by their lack of artefacts caused by interference.
引用
收藏
页码:179 / 187
页数:9
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