A TEM STUDY OF BI2SR2CACU2OX SUPERCONDUCTING THIN-FILMS ON SRTIO3 SUBSTRATES

被引：8

作者：

ZHANG, XF

KABIUS, B

URBAN, K

SCHMITT, P

SCHULTZ, L

SAEMANNISCHENKO, G

机构：

[1] SIEMENS AG, W-8520 ERLANGEN, GERMANY

[2] UNIV ERLANGEN NURNBERG, INST PHYS, W-8520 ERLANGEN, GERMANY

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1991年 / 183卷 / 4-6期

关键词：

D O I：

10.1016/0921-4534(91)90586-N

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

As-deposited Bi2Sr2CaCu2Ox film on (001) SrTiO3 substrates produced by laser deposition are investigated in a high-resolution electron microscope. The films are well-orientated with the crystallographic c-axis and a-axis direction of the films parallel to the [001] and [110] direction of the substrate, respectively. The substrate/film interface is sharp and good crystalline order is build up from the interface. Misfit dislocations were found inside the film nearby the interface. Planar defects occur in the films. In particular, 90-degrees-rotation twins are found with the rotation axis parallel to the c-axis. The growth mechanism of the films and the effect of the lattice defects on flux pinning is discussed.

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页码：379 / 387

页数：9

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