SUPPRESSION OF ALUMINUM HILLOCK GROWTH BY OVERLAYERS OF SILICON DIOXIDE CHEMICALLY-VAPOR-DEPOSITED AT LOW-TEMPERATURE

被引:9
作者
LEARN, AJ
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1986年 / 4卷 / 03期
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D O I
10.1116/1.583567
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:774 / 776
页数:3
相关论文
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[2]   RECENT DEVELOPMENTS IN STUDY OF MECHANICAL PROPERTIES OF THIN-FILMS [J].
KINOSITA, K .
THIN SOLID FILMS, 1972, 12 (01) :17-&
[4]   PHOSPHORUS INCORPORATION EFFECTS IN SILICON DIOXIDE GROWN AT LOW-PRESSURE AND TEMPERATURE [J].
LEARN, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (02) :405-409
[5]  
Perry R.H., 1973, CHEM ENG HDB