AUGER STUDIES OF AU DIFFUSION THROUGH PT FILMS - DEPENDENCE ON ANNEALING AMBIENT

被引:14
作者
CHANG, CC [1 ]
QUINTANA, G [1 ]
机构
[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
关键词
D O I
10.1063/1.89141
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:453 / 454
页数:2
相关论文
共 7 条
[1]   INTERDIFFUSIONS IN THIN-FILM AU ON PT ON GAAS (100) STUDIES WITH AUGER-SPECTROSCOPY [J].
CHANG, CC ;
MURARKA, SP ;
KUMAR, V ;
QUINTANA, G .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) :4237-4243
[2]   GENERAL FORMALISM FOR QUANTITATIVE AUGER ANALYSIS [J].
CHANG, CC .
SURFACE SCIENCE, 1975, 48 (01) :9-21
[3]   DIFFUSION KINETICS OF AU THROUGH PT FILMS ABOUT 2000 AND 6000A THICK STUDIED WITH AUGER-SPECTROSCOPY [J].
CHANG, CC ;
QUINTANA, G .
THIN SOLID FILMS, 1976, 31 (03) :265-273
[4]  
CHANG CC, 1974, CHARACTERIZATION SOL, pCH20
[5]  
CHANG CD, UNPUBLISHED
[6]   FABRICATION AND NOISE PERFORMANCE OF HIGH-POWER GAAS IMPATTS [J].
IRVIN, JC ;
COLEMAN, DJ ;
JOHNSON, WA ;
TATSUGUC.I ;
DECKER, DR ;
DUNN, CN .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (08) :1212-&
[7]   BEAM-LEAD TECHNOLOGY [J].
LEPSELTE.MP .
BELL SYSTEM TECHNICAL JOURNAL, 1966, 45 (02) :233-&