WAVELENGTH SELECTION FOR TRACE ANALYSIS BY ICP-AES

被引:20
作者
MCLAREN, JW
BERMAN, SS
机构
关键词
D O I
10.1016/0584-8547(85)80024-0
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
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页码:217 / 225
页数:9
相关论文
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