ENERGY-DISPERSIVE METHOD USED FOR NON-SPECULAR X-RAY-SCATTERING FROM MULTILAYER STRUCTURE

被引:3
作者
MALAURENT, JC
DHEZ, P
DUVAL, H
机构
[1] UNIV PARIS 11,SPECTROSCOPIE ATOM & ION LAB,F-91405 ORSAY,FRANCE
[2] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE
关键词
Electromagnetic wave scattering - Light absorption - Photons - Refractive index - Silicon sensors - X ray diffraction - X ray tubes;
D O I
10.1016/0030-4018(94)90583-5
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The Energy Dispersive method (EDM) is used to study the non-specular diffraction of X-rays by multilayers. The EDM experimental results obtained are compared with those obtained on the same multilayer with the classical Angular Dispersive method (ADM). The ADM is performed with monochromatic X-rays, so that it is necessary to rotate sample or detector in order to obtain the non-specular intensity distribution. Monochromatic X-rays are an advantage to interpret the results because the absorption coefficient and the index of refraction are constant parameters for the used wavelength. The EDM uses the continuum spectrum of an X-ray tube and the scattered photons spectral distribution is analysed with a Si(Li) detector. The multilayer absorption and refractive index change with the energy, but the advantage is that no instrument motion is required and measurements are made easier by a simultaneous registration for all energies. The complementarity of both methods is briefly discussed.
引用
收藏
页码:1 / 8
页数:8
相关论文
共 9 条
[1]   INTERFERENCE EFFECT IN NON-SPECULAR SCATTERING FROM MULTILAYERS INTERPRETATION OF THE ROCKING CURVES [J].
BRUSON, A ;
DUFOUR, C ;
GEORGE, B ;
VERGNAT, M ;
MARCHAL, G ;
MANGIN, P .
SOLID STATE COMMUNICATIONS, 1989, 71 (12) :1045-1050
[2]  
Dhez P, 1992, J Xray Sci Technol, V3, P176, DOI [10.1016/0895-3996(92)90009-9, 10.3233/XST-1992-3303]
[3]  
DHEZ P, 1988, P SPIE, V984, P89
[4]   NONSPECULAR X-RAY-SCATTERING FROM THE AMORPHOUS STATE IN W/C MULTILAYERS [J].
JIANG, XM ;
METZGER, TH ;
PEISL, J .
APPLIED PHYSICS LETTERS, 1992, 61 (08) :904-906
[5]  
KORTRIGHT JB, 1991, J APPL PHYS, V70, P620
[6]  
MAJKRAZAK CF, NIST19891990 REACT R
[7]   CHARACTERIZATION OF X-UV MULTILAYERS BY GRAZING-INCIDENCE X-RAY REFLECTOMETRY [J].
NEVOT, L ;
PARDO, B ;
CORNO, J .
REVUE DE PHYSIQUE APPLIQUEE, 1988, 23 (10) :1675-1686
[8]   ENERGY-DISPERSIVE DIFFUSE-X-RAY SCATTERING TECHNIQUE .1. PRINCIPLES [J].
REID, JS .
ACTA CRYSTALLOGRAPHICA SECTION A, 1993, 49 :190-198
[9]  
WARBURTON WK, 1984, SPRINGER SERIES OPTI, V43, P163