DETERMINATION OF RELATIVE INTENSITY IN X-RAY REFLECTION STUDY

[1] Bohlin H, 1920, ANN PHYS-BERLIN, V61, P421

[2] CHERNOCK WP, 1952, J APPL PHYS, V23, P34

[3] PREFERRED ORIENTATION DETERMINATION USING A GEIGER COUNTER X-RAY DIFFRACTION GONIOMETER [J]. JOURNAL OF APPLIED PHYSICS, 1948, 19 (04) : 388 - 392

[4] Klug H.P., 1954, XRAY DIFFRACTION PRO, P235

[5] KLUG HP, 1954, XRAY DIFFRACTION PRO, P211

[6] A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1030 - 1032

[7] DETERMINATION OF PREFERRED ORIENTATION IN FLAT TRANSMISSION SAMPLES USING A GEIGER COUNTER X-RAY SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1033 - 1035

[8] A focussing x-ray spectroscopic configuration for crystal powder [J]. ANNALEN DER PHYSIK, 1919, 59 (13) : 455 - 464

[1] Bohlin H, 1920, ANN PHYS-BERLIN, V61, P421

[2] CHERNOCK WP, 1952, J APPL PHYS, V23, P34

[3] PREFERRED ORIENTATION DETERMINATION USING A GEIGER COUNTER X-RAY DIFFRACTION GONIOMETER [J]. JOURNAL OF APPLIED PHYSICS, 1948, 19 (04) : 388 - 392

[4] Klug H.P., 1954, XRAY DIFFRACTION PRO, P235

[5] KLUG HP, 1954, XRAY DIFFRACTION PRO, P211

[6] A DIRECT METHOD OF DETERMINING PREFERRED ORIENTATION OF A FLAT REFLECTION SAMPLE USING A GEIGER COUNTER X-RAY SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1030 - 1032

[7] DETERMINATION OF PREFERRED ORIENTATION IN FLAT TRANSMISSION SAMPLES USING A GEIGER COUNTER X-RAY SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (11) : 1033 - 1035

[8] A focussing x-ray spectroscopic configuration for crystal powder [J]. ANNALEN DER PHYSIK, 1919, 59 (13) : 455 - 464