INVESTIGATION OF SOFT UPSETS IN INTEGRATED-CIRCUIT MEMORIES AND CHARGE COLLECTION IN SEMICONDUCTOR TEST STRUCTURES BY THE USE OF AN ION MICROBEAM

被引：9

作者：

KNUDSON, AR

CAMPBELL, AB

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91054-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：625 / 631

页数：7

共 9 条

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[2]

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[3]

HSIEH CM, 1981, 19TH IEEE ANN P REL, P38

[4] ALPHA-PARTICLE-INDUCED FIELD AND ENHANCED COLLECTION OF CARRIERS [J].

HU, C .

ELECTRON DEVICE LETTERS, 1982, 3 (02) :31-34

[5] APPLICATIONS OF A MICROBEAM TO THE PROBLEM OF SOFT UPSETS IN INTEGRATED-CIRCUIT MEMORIES [J].

KNUDSON, AR ;

CAMPBELL, AB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (02) :1232-1235

[6] ALPHA-PARTICLE-INDUCED SOFT ERRORS IN DYNAMIC MEMORIES [J].

MAY, TC ;

WOODS, MH .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) :2-9

[7]

MCLEAN FB, 1982, IEEE T NUCL SCI, V29, P2018

[8] COLLECTION OF CHARGE ON JUNCTION NODES FROM ION TRACKS [J].

MESSENGER, GC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2024-2031

[9] ALPHA-PARTICLE TRACKS IN SILICON AND THEIR EFFECT ON DYNAMIC MOS RAM RELIABILITY [J].

YANEY, DS ;

NELSON, JT ;

VANSKIKE, LL .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) :10-16

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