PRECISION-MEASUREMENTS OF THE ABSOLUTE PHOTOIONIZATION CROSS-SECTIONS OF HE

被引：153

作者：

SAMSON, JAR

HE, ZX

YIN, L

HADDAD, GN

机构：

[1] Behlen Laboratory of Physics, University of Nebraska, Lincoln, NE

[2] Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, Shanghai

[3] CSIRO Division of applied Physics, LindIield, NSW, 2080

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1994年 / 27卷 / 05期

关键词：

D O I：

10.1088/0953-4075/27/5/008

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Precision photoionization cross sections for He have been measured from threshold to 120 eV with an accuracy ranging from 1 to 2%. In addition, a critical review of the published data has been made and recommended photoionization cross sections from the ionization threshold to 8 keV are presented with an estimated uncertainty of +/- 10% above 500 eV. The effect of coherent (Rayleigh) and incoherent (Compton) scattering is discussed.

引用

页码：887 / 898

页数：12

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