CHARACTERIZATION OF COPPER ENAMEL INTERFACIAL REACTIONS DURING AGING

被引：13

作者：

BURRELL, MC ^{[1
]}

KEANE, JJ ^{[1
]}

机构：

[1] GE,DIV SILICONE PROD BUSINESS,SCHENECTADY,NY 12345

来源：

SURFACE AND INTERFACE ANALYSIS | 1988年 / 11卷 / 09期

关键词：

D O I：

10.1002/sia.740110905

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：487 / 496

页数：10

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