ISOTHERMAL FREQUENCY SCAN DLTS

[1] FERENCZI G, 1984, Patent No. 4437060

[2] DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) : 3023 - 3032

[3] SEVERIN PJ, 1982, J ELECTROCHEM SOC, V119, P1384

[1] FERENCZI G, 1984, Patent No. 4437060

[2] DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) : 3023 - 3032

[3] SEVERIN PJ, 1982, J ELECTROCHEM SOC, V119, P1384