IMAGE FORCE EFFECTS IN ELECTRON-MICROSCOPY

被引:53
作者
ECHENIQUE, PM
HOWIE, A
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D O I
10.1016/0304-3991(85)90082-8
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TH742 [显微镜];
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页码:269 / 272
页数:4
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  • [1] IMAGE FORCE FOR A PARTICLE MOVING NEAR A SOLID-SURFACE
    BARBERAN, N
    ECHENIQUE, PM
    VINAS, J
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (03): : L111 - L114
  • [2] MICRO-DIFFRACTION, STEM IMAGING AND ELS AT CRYSTAL-SURFACES
    COWLEY, JM
    [J]. ULTRAMICROSCOPY, 1982, 9 (03) : 231 - 236
  • [3] THE ACCOMPLISHMENTS AND PROSPECTS OF HIGH-RESOLUTION IMAGING METHODS
    COWLEY, JM
    [J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 1 - 12
  • [4] ENERGY-LOSSES OF FAST ELECTRONS AT CRYSTAL-SURFACES
    COWLEY, JM
    [J]. PHYSICAL REVIEW B, 1982, 25 (02): : 1401 - 1404
  • [5] STUDY OF SINGLE-ELECTRON EXCITATIONS BY ELECTRON-MICROSCOPY .1. IMAGE-CONTRAST FROM DELOCALIZED EXCITATIONS
    CRAVEN, AJ
    GIBSON, JM
    HOWIE, A
    SPALDING, DR
    [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 38 (05): : 519 - 527
  • [6] ABSORPTION PROFILE AT SURFACES
    ECHENIQUE, PM
    PENDRY, JB
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (18): : 2936 - 2942
  • [7] SEMI-CLASSICAL IMAGE POTENTIAL AT A SOLID-SURFACE
    ECHENIQUE, PM
    RITCHIE, RH
    BARBERAN, N
    INKSON, J
    [J]. PHYSICAL REVIEW B, 1981, 23 (12): : 6486 - 6493
  • [8] SURFACE-REACTIONS AND EXCITATIONS
    HOWIE, A
    [J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 141 - 148
  • [9] JACKSON JD, 1975, CLASSICAL ELECTRODYN, P396
  • [10] OBSERVATION OF THE IMAGE FORCE FOR FAST ELECTRONS NEAR AN MGO SURFACE
    MARKS, LD
    [J]. SOLID STATE COMMUNICATIONS, 1982, 43 (10) : 727 - 729