CLARIFICATION OF THE EFFECT OF BIAS IN THE HOT FILAMENT PROCESS

被引:14
作者
BANHOLZER, W
KEHL, R
机构
[1] GE Corporate Research, Development Center, NY 12301, Building K1
关键词
D O I
10.1016/0257-8972(91)90267-Z
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effect of applying d.c. and a.c. bias in the hot-filament process was investigated using in situ rate determination. Biasing the substrate 150 V positive relative to the filament caused a rise in substrate temperature. Adjusting the filament power to maintain a constant substrte temperature when applying the bias did not increase the deposition rate. A bias of less than 120 V did not affect the deposition rate. The positive substrate bias resulted in a slightly higher nucleation density and shortened the incubation time to reach steady state growth but also decreased the diamond quality.
引用
收藏
页码:51 / 58
页数:8
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