CHARACTERIZATION OF VAPOR-DEPOSITED SILVER FILMS EXHIBITING SURFACE-ENHANCED RAMAN-SCATTERING BY RAMAN AND X-RAY PHOTO-ELECTRON SPECTROSCOPY

被引：9

作者：

DELPRIORE, LV ^{[1
]}

DOYLE, C ^{[1
]}

ANDRADE, JD ^{[1
]}

机构：

[1] UNIV UTAH,DEPT BIOENGN & SURFACE ANALY,SALT LAKE CITY,UT 84112

来源：

APPLIED SPECTROSCOPY | 1982年 / 36卷 / 01期

关键词：

D O I：

10.1366/0003702824639088

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：69 / 71

页数：3

共 30 条

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