AUGER-ELECTRON SPECTROSCOPIC STUDY OF THE ETCHING OF CADMIUM TELLURIDE AND CADMIUM MANGANESE TELLURIDE

被引：45

作者：

FELDMAN, RD

OPILA, RL

BRIDENBAUGH, PM

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 05期

关键词：

D O I：

10.1116/1.572912

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1988 / 1991

页数：4

共 10 条

[1] RAMAN-SCATTERING STUDY OF THE PROPERTIES AND REMOVAL OF EXCESS TE ON CDTE SURFACES
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POLLAK, FH
[J]. APPLIED PHYSICS LETTERS, 1984, 45 (07) : 789 - 791
[2] DISTRIBUTION COEFFICIENT OF MN IN CD1-XMNXTE SINGLE-CRYSTALS
BRIDENBAUGH, PM
[J]. MATERIALS LETTERS, 1985, 3 (7-8) : 287 - 289
[3] DILUTED MAGNETIC SEMICONDUCTORS - AN INTERFACE OF SEMICONDUCTOR PHYSICS AND MAGNETISM
FURDYNA, JK
[J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (11) : 7637 - 7643
[4] ETCHING OF CADMIUM TELLURIDE
GAUGASH, P
MILNES, AG
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (04) : 924 - 926
[5] ICHIMURA S, 1983, SURF SCI, V124, pL49, DOI 10.1016/0039-6028(83)90791-4
[6] SURFACE-LAYERS ON CADMIUM TELLURIDE
PATTERSON, MH
WILLIAMS, RH
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (05) : L83 - L86
[7] X-RAY PHOTOELECTRON AND AUGER-ELECTRON SPECTROSCOPIC STUDY OF THE CDTE SURFACE RESULTING FROM VARIOUS SURFACE PRETREATMENTS - CORRELATION OF PHOTOELECTROCHEMICAL AND CAPACITANCE-POTENTIAL BEHAVIOR WITH SURFACE CHEMICAL-COMPOSITION
RICCO, AJ
WHITE, HS
WRIGHTON, MS
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 910 - 915
[8] SCAH MP, 1979, SURF INTERFACE ANAL, V1, P2
[9] GROWTH AND CHARACTERIZATION OF CD1-XMNXTE AND MNTE CRYSTALS - CONTRIBUTION TO THE CDTE-MNTE PSEUDO-BINARY PHASE-DIAGRAM DETERMINATION
TRIBOULET, R
DIDIER, G
[J]. JOURNAL OF CRYSTAL GROWTH, 1981, 52 (APR) : 614 - 618
[10] BOUND MAGNETIC POLARONS IN DILUTE MAGNETIC SEMICONDUCTORS
WOLFF, PA
WARNOCK, J
[J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (06) : 2300 - 2304

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