ELLIPSOMETRY AS A DIAGNOSTIC FOR THE MEASUREMENT OF EROSION AND REDEPOSITION IN A TOKAMAK

被引：3

作者：

DAVIES, SJ ^{[1
]}

MONK, RD ^{[1
]}

机构：

[1] UNIV LONDON,ROYAL HOLLOWAY & BEDFORD NEW COLL,DEPT PHYS,SURREY TW20 0EX,ENGLAND

来源：

JOURNAL OF NUCLEAR MATERIALS | 1992年 / 196卷

关键词：

D O I：

10.1016/S0022-3115(06)80028-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ellipsometry has been studied as a possible technique for quantitative measurements of erosion and redeposition in a tokamak. The technique can determine film thickness down to typically approximately 1 nm and it is being considered for the pumped divertor phase of JET. Various aspects of ellipsometry relevant to its implementation on a tokamak are discussed. An ellipsometric system capable of performing in situ erosion/redeposition measurements with sufficient accuracy is described.

引用

页码：184 / 188

页数：5

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