AUTOMATED-SYSTEM FOR RESISTANCE AND CRITICAL CURRENT MEASUREMENTS

被引：7

作者：

WNUK, JJ

EGGENKAMP, PJT

VANDERLINDEN, PJE

VANDERSTEEN, HJL

机构：

[1] Research Institute for Materials, University of Nijmegen, Toernooiveld

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 07期

关键词：

D O I：

10.1063/1.1142426

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An apparatus is described for measuring the temperature and magnetic field dependencies of the resistance and critical current of high-temperature superconductors. The automated setup together with a set of inserts forms a universal system allowing for fast sample selection as well as for accurate complementary measurements at temperatures from 4.2 to 300 K and in high magnetic fields up to 30 T. Design details and low resistance measuring algorithm are presented and system performance is discussed.

引用

页码：1813 / 1818

页数：6

共 6 条

[1] POSSIBLE HIGH-TC SUPERCONDUCTIVITY IN THE BA-LA-CU-O SYSTEM [J].