HIGH-RESOLUTION ANGLE-RESOLVED PHOTOELECTRON SPECTROMETER SYSTEM

被引：38

作者：

PARR, AC

SOUTHWORTH, SH

DEHMER, JL

HOLLAND, DMP

机构：

[1] ARGONNE NATL LAB, ARGONNE, IL 60439 USA

[2] SRC, DARESBURY LAB, SRC, WARRINGTON WA4 4AD, CHESHIRE, ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1984年 / 222卷 / 1-2期

关键词：

D O I：

10.1016/0167-5087(84)90534-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：221 / 229

页数：9

共 32 条

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[9] THE ANGULAR-DISTRIBUTION PARAMETERS OF ARGON, KRYPTON AND XENON FOR USE IN CALIBRATION OF ELECTRON SPECTROMETERS [J].

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