USE OF CONVERSION X-RAYS FOR MEASUREMENT OF PHOTOELECTRIC CROSS-SECTIONS

被引：4

作者：

ALLAWADHI, KL ^{[1
]}

SOOD, BS ^{[1
]}

机构：

[1] PUNJABI UNIV,DEPT PHYS,NUCL SCI LABS,PATIALA 147002,INDIA

来源：

NUCLEAR INSTRUMENTS & METHODS | 1975年 / 129卷 / 02期

关键词：

D O I：

10.1016/0029-554X(75)90742-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：493 / 495

页数：3

共 7 条

[1]

ALLAWADHI KL, 1973, CURR SCI INDIA, V42, P86

[2]

ALLAWADHI KL, IN PRESS

[3] ATOMIC PHOTOELECTRIC EFFECT ABOVE 10 KEV [J].

PRATT, RH ;

RON, A ;

TSENG, HK .

[4]

SCOFIELD JH, 1973, UCRL51326 REP

[5] LIFETIME OF THE 961 KEV1- LEVEL IN SM-152 [J].

SHUTE, GG ;

SOOD, BS .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 257 (1288) :52-58

[6]

SINGH M, 1963, INDIAN J PURE APPL P, V1, P305

SINGH, MI ;

SOOD, BS .

NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B, 1972, B 8 (01) :261-&