ELECTRON TEMPERATURES AND ELECTRON CONCENTRATIONS AT LOW-PRESSURE IN MICROWAVE INDUCED PLASMAS

被引：52

作者：

BRASSEM, P ^{[1
]}

MAESSEN, FJM ^{[1
]}

机构：

[1] UNIV AMSTERDAM,LAB ANAL CHEM,NIEUWE ACHTERGRACHT 166,AMSTERDAM,NETHERLANDS

来源：

关键词：

D O I：

10.1016/0584-8547(74)80024-8

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：203 / 210

页数：8

共 5 条

[1] FUNDAMENTAL PROPERTIES CHARACTERIZING LOW-PRESSURE MICROWAVE-INDUCED PLASMAS AS EXCITATION SOURCES FOR SPECTROANALYTICAL CHEMISTRY
BUSCH, KW
VICKERS, TJ
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1973, B 28 (03) : 85 - 104
[2] Huddlestone RH, 1965, PLASMA DIAGNOSTIC TE, p[150, 183]
[3] HUDDLESTONE RH, 1965, PLASMA DIAGNOSTIC TE, P206
[4] A FLOATING DOUBLE PROBE METHOD FOR MEASUREMENTS IN GAS DISCHARGES
JOHNSON, EO
MALTER, L
[J]. PHYSICAL REVIEW, 1950, 80 (01): : 58 - 68
[5] SPANGENBERG KR, 1948, VACUUM TUBES, P176