LASER-SURFACE DIAGNOSTICS OF GAAS GROWTH-PROCESSES .2. REFLECTANCE ANISOTROPY STUDIES OF GAAS GROWTH BY MBE

被引:13
作者
ARMSTRONG, SR
PEMBLE, ME
TAYLOR, AG
JOYCE, BA
NEAVE, JH
ZHANG, J
KLUG, DA
机构
[1] IMPERIAL COLL SCI TECHNOL & MED,DEPT BIOCHEM,IRC SEMICOND,LONDON,ENGLAND
[2] UNIV MANCHESTER,INST SCI & TECHNOL,CTR ELECTR MAT,MANCHESTER M60 1QD,LANCS,ENGLAND
关键词
D O I
10.1016/0169-4332(92)90093-D
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The relationship between reflectance anisotropy (RA) signals and As or Ga coverage on GaAs (100) has been investigated by monitoring the RA response through a series of surface reconstructions generated under MBE growth conditions. Under As-rich conditions for which RHEED indicated c(4 x 4) reconstruction the substrate was heated to promote As2 desorption and distinct desorption transients were observed superimposed upon an approximately monotonic variation in the RA signal which correlate with the observation of the c(4 x 4)As to (2 x 4), (2 x 4) to (3 x 1) and (3 x 1) to (4 x 2)Ga RHEED transitions. These phase transitions were observed to be reversible. It is suggested that these phase transitions involve three distinct types of As species each resulting from the unique nature of each reconstruction, and that the experiment performed here may be thought of as an "optical" thermal desorption experiment.
引用
收藏
页码:493 / 496
页数:4
相关论文
共 14 条
[1]  
ARMSTRONG SK, UNPUB
[3]   OPTICAL STUDIES OF MOLECULAR-BEAM EPITAXY GROWTH OF GAAS AND ALAS [J].
ASPNES, DE ;
HARBISON, JP ;
STUDNA, AA ;
FLOREZ, LT ;
KELLY, MK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (04) :1127-1131
[4]  
ASPNES DE, 1987, MATER RES SOC S P, V91, P57
[5]   APPLICATION OF REFLECTANCE DIFFERENCE SPECTROSCOPY (RDS) TO MIGRATION-ENHANCED EPITAXY (MEE) GROWTH OF GAAS [J].
BRIONES, F ;
HORIKOSHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1990, 29 (06) :1014-1021
[6]   ATOMIC-STRUCTURE OF GAAS(100)-(2X1) AND GAAS(100)-(2X4) RECONSTRUCTED SURFACES [J].
CHADI, DJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :834-837
[7]   INSITU MONITORING OF CRYSTAL-GROWTH BY REFLECTANCE DIFFERENCE SPECTROSCOPY [J].
COLAS, E ;
ASPNES, DE ;
BHAT, R ;
STUDNA, AA ;
HARBISON, JP ;
FLOREZ, LT ;
KOZA, MA ;
KERAMIDAS, VG .
JOURNAL OF CRYSTAL GROWTH, 1991, 107 (1-4) :47-55
[8]   COMPOSITION AND STRUCTURE OF DIFFERENTLY PREPARED GAAS(100) SURFACES STUDIED BY LEED AND AES [J].
DRATHEN, P ;
RANKE, W ;
JACOBI, K .
SURFACE SCIENCE, 1978, 77 (01) :L162-L166
[9]   OPTICAL REFLECTANCE MEASUREMENTS OF TRANSIENTS DURING MOLECULAR-BEAM EPITAXIAL-GROWTH ON (001) GAAS [J].
HARBISON, JP ;
ASPNES, DE ;
STUDNA, AA ;
FLOREZ, LT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (02) :740-742
[10]   OSCILLATIONS IN THE OPTICAL-RESPONSE OF (001)GAAS AND ALGAAS SURFACES DURING CRYSTAL-GROWTH BY MOLECULAR-BEAM EPITAXY [J].
HARBISON, JP ;
ASPNES, DE ;
STUDNA, AA ;
FLOREZ, LT ;
KELLY, MK .
APPLIED PHYSICS LETTERS, 1988, 52 (24) :2046-2048