THEORY OF THE PHOTOREFRACTIVE EFFECT FOR BI12SIO20 AND BATIO3 WITH SHALLOW TRAPS

被引:180
作者
TAYEBATI, P [1 ]
MAHGEREFTEH, D [1 ]
机构
[1] UNIV SO CALIF,DEPT PHYS,LOS ANGELES,CA 90089
关键词
D O I
10.1364/JOSAB.8.001053
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We analytically solve charge-transport equations for a photorefractive crystal with shallow and deep traps. We predict that, if shallow traps can accumulate a high density of charge, the photorefractive trap density and space-charge field will be strong functions of light intensity and the photoconductivity will scale sublinearly with intensity. We show that, depending on light intensity and grating spacing, shallow-trap charge gratings form either in phase or out of phase with the light pattern. As shallow traps thermally depopulate in the dark, the space-charge field either partially decays or partially develops for a few seconds. The amount of decay increases as grating spacing increases in Bi12SiO20 and as grating spacing decreases in BaTiO3.
引用
收藏
页码:1053 / 1064
页数:12
相关论文
共 24 条
[1]   INTENSITY-DEPENDENT ABSORPTION AND PHOTOREFRACTIVE EFFECTS IN BARIUM-TITANATE [J].
BROST, GA ;
MOTES, RA ;
ROTGE, JR .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1988, 5 (09) :1879-1885
[2]  
CHANG TY, 1986, THESIS U SO CALIFORN
[3]  
CUDNEY RS, UNPUB J OPT SOC AM B
[4]   SPEED OF THE PHOTOREFRACTIVE EFFECT IN A BATIO3 SINGLE-CRYSTAL [J].
DUCHARME, S ;
FEINBERG, J .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (03) :839-842
[5]  
DUCHARME S, 1986, THESIS U SO CLAIFORN
[6]   CORRECTION [J].
FEINBERG, J .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (01) :537-537
[7]   PHOTOREFRACTIVE EFFECTS AND LIGHT-INDUCED CHARGE MIGRATION IN BARIUM-TITANATE [J].
FEINBERG, J ;
HEIMAN, D ;
TANGUAY, AR ;
HELLWARTH, RW .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (03) :1297-1305
[8]   A MODEL FOR THE NONLINEAR PHOTOCONDUCTIVITY OF BATIO3 [J].
HOLTMANN, L .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 113 (01) :K89-K93
[9]   HOLOGRAPHIC STORAGE IN ELECTROOPTIC CRYSTALS .1. STEADY-STATE [J].
KUKHTAREV, NV ;
MARKOV, VB ;
ODULOV, SG ;
SOSKIN, MS ;
VINETSKII, VL .
FERROELECTRICS, 1979, 22 (3-4) :949-960
[10]  
LASHER ME, 1990, 1990 OSA TECHN DIG S, V7, P92