THICKNESS DEPENDENCE OF COMPOSITION IN ELECTROPLATED NI-FE CYLINDRICAL FILMS

被引:18
作者
DOYLE, WD
机构
关键词
D O I
10.1063/1.1709657
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1441 / &
相关论文
共 8 条
[1]   MEASUREMENTS OF SKEW DISPERSION + CREEP IN PLATED WIRES [J].
BELSON, HS .
IEEE TRANSACTIONS ON COMMUNICATION AND ELECTRONICS, 1964, 83 (72) :317-&
[2]   VARIATION OF COMPOSITION WITH THICKNESS IN THIN ELECTRODEPOSITED FILMS OF NICKEL-IRON ALLOYS [J].
COCKETT, GH ;
SPENCERTIMMS, ES .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (09) :906-908
[3]   EPITAXIAL INFLUENCE OF SUBSTRATES ON ANISOTROPY IN THIN ELECTRODEPOSITED NI-FE CYLINDRICAL FILMS [J].
DOYLE, WD .
PHYSICA STATUS SOLIDI, 1966, 17 (01) :K67-&
[4]   THE ELETRODEPOSITION OF NICKEL-IRON-PHOSPHORUS THIN FILMS FOR COMPUTER MEMORY USE [J].
FREITAG, WO ;
MATHIAS, JS ;
DIGUILIO, G .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (01) :35-39
[6]  
HENSTOCK ME, 1964, 6 ANN MET FIN C LOND
[7]   MAGNETOELASTIC SENSITIVITY AND COMPOSITION OF PERMALLOY FILMS [J].
LONG, TR .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (03) :1470-&
[8]   ELECTRODEPOSITED MEMORY ELEMENTS FOR A NONDESTRUCTIVE MEMORY [J].
LONG, TR .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (05) :S123-S124