WAVE-ABERRATION TESTING SYSTEM FOR MICRO-LENSES BY SHEARING INTERFERENCE METHOD

被引：4

作者：

KOKUBUN, Y ^{[1
]}

USUI, T ^{[1
]}

OIKAWA, M ^{[1
]}

IGA, K ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,PRECIS MACHINERY & ELECTR RES LAB,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1984年 / 23卷 / 01期

关键词：

D O I：

10.1143/JJAP.23.101

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：101 / 104

页数：4

共 10 条

[1] RAPID AUTOMATIC INDEX PROFILING OF WHOLE-FIBER SAMPLES .1. [J].

BOGGS, LM ;

PRESBY, HM ;

MARCUSE, D .

BELL SYSTEM TECHNICAL JOURNAL, 1979, 58 (04) :867-882

[2]

Kokubun Y., 1977, Transactions of the Institute of Electronics and Communication Engineers of Japan, Section E (English), VE60, P702

[3] INDEX PROFILING OF DISTRIBUTED-INDEX LENSES BY A SHEARING INTERFERENCE METHOD [J].

KOKUBUN, Y ;

IGA, K .

APPLIED OPTICS, 1982, 21 (06) :1030-1034

[4]

Kokubun Y., 1978, Transactions of the Institute of Electronics and Communication Engineers of Japan, Section E (English), VE61, P184

[5] REFRACTIVE-INDEX PROFILE MEASUREMENT OF PREFORM RODS BY A TRANSVERSE DIFFERENTIAL INTERFEROGRAM [J].

KOKUBUN, Y ;

IGA, K .

APPLIED OPTICS, 1980, 19 (06) :846-851

[6]

KUBOTA H, 1971, WAVE OPTICS, P179

[7]

MALACARA D, 1978, OPTICAL SHOP TESTING, P125

[8] DISTRIBUTED-INDEX PLANAR MICROLENS [J].

OIKAWA, M ;

IGA, K .

APPLIED OPTICS, 1982, 21 (06) :1052-1056

[9] DISTRIBUTED-INDEX PLANAR MICROLENS ARRAY PREPARED FROM DEEP ELECTROMIGRATION [J].

OIKAWA, M ;

IGA, K ;

SANADA, T .

ELECTRONICS LETTERS, 1981, 17 (13) :452-454

[10] RAPID AUTOMATIC INDEX PROFILING OF WHOLE-FIBER SAMPLES .2. [J].

PRESBY, HM ;

MARCUSE, D ;

ASTLE, HW ;

BOGGS, LM .

BELL SYSTEM TECHNICAL JOURNAL, 1979, 58 (04) :883-902

← 1 →