THE CRYSTAL-STRUCTURE OF RUSSELLITE - A REDETERMINATION USING NEUTRON POWDER DIFFRACTION OF SYNTHETIC BI2WO6

被引:120
作者
KNIGHT, KS
机构
关键词
RUSSELLITE; CRYSTAL STRUCTURE; RIETVELD ANALYSIS; NEUTRON DIFFRACTION;
D O I
10.1180/minmag.1992.056.384.13
中图分类号
P57 [矿物学];
学科分类号
070901 ;
摘要
The crystal structure of the displacive ferroelectric mineral russellite, Bi2WO6, has been determined using Rietveld profile refinement of high-resolution, time of flight, neutron powder diffraction data on the synthetic compound. Russellite is orthorhombic, Pca2(1), with a 5.43726(2) angstrom, b 16.43018(5) angstrom, c 5.458422) angstrom, Z = 4 and is isostructural with the bismuth molybdate mineral koechlinite, Bi2MoO6. The structure consists of layers of tilted WO6 octahedra sandwiched between layers of bismuth and oxygen with the tungsten displaced from the centre of the octahedron by 0.278 angstrom. The orientations of the lone-pair electrons in the Bi3+ cations have been inferred from the 3.0 angstrom coordination shells of both crystallographically independent bismuths, and have been found to be non-centrosymmetric, an effect which may give rise to the tilting of the WO6 octahedra. New laboratory source X-ray powder diffraction data are presented for russellite, which, with supplementary synchrotron powder diffractometry, corroborate the new space group and structure determination.
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页码:399 / 409
页数:11
相关论文
共 45 条
[1]   ATOMIC DISPLACEMENT RELATIONSHIP TO CURIE TEMPERATURE AND SPONTANEOUS POLARIZATION IN DISPLACIVE FERROELECTRICS [J].
ABRAHAMS, SC ;
KURTZ, SK ;
JAMIESON, PB .
PHYSICAL REVIEW, 1968, 172 (02) :551-&
[2]   A VOIGTIAN AS PROFILE SHAPE FUNCTION IN RIETVELD REFINEMENT [J].
AHTEE, M ;
UNONIUS, L ;
NURMELA, M ;
SUORTTI, P .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (OCT) :352-357
[3]  
AURIVILLIUS B, 1952, ARK KEMI, V5, P39
[4]   POLYMORPHISM OF BI2MOO6 [J].
BLASSE, G .
JOURNAL OF INORGANIC & NUCLEAR CHEMISTRY, 1966, 28 (04) :1124-&
[5]   HIGH OXIDE ION CONDUCTIVITY IN BISMUTH URANATE, BI2UO6 [J].
BONANOS, N .
MATERIALS RESEARCH BULLETIN, 1989, 24 (12) :1531-1540
[6]   TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 7 (09) :238-&
[7]   BOND-VALENCE PARAMETERS OBTAINED FROM A SYSTEMATIC ANALYSIS OF THE INORGANIC CRYSTAL-STRUCTURE DATABASE [J].
BROWN, ID ;
ALTERMATT, D .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1985, 41 (AUG) :244-247
[8]  
BROWN PJ, 1987, RAL87010 REP
[9]  
CERNIK RJ, 1989, DLSCIP669E DAR PREPR
[10]   PROFILE REFINEMENT OF POWDER DIFFRACTION PATTERNS USING THE VOIGT FUNCTION [J].
DAVID, WIF ;
MATTHEWMAN, JC .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1985, 18 (DEC) :461-466