THICK SPECIMENS IN CEM AND STEM - RESOLUTION AND IMAGE-FORMATION

被引：39

作者：

GROVES, T

机构：

[1] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637

[2] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

关键词：

D O I：

10.1016/S0304-3991(75)80005-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：15 / 31

页数：17

共 21 条

[1]

BECK V, TO BE PUBLISHED

[2]

BIBERMAN LM, 1973, PERCEPTION DISPLAYED, pCH2

[3]

Chandrasekhar S., 1960, RADIATIVE TRANSFER

[4]

COWLEY JM, 1974, 8TH P INT C EL MICR, P19

[5] THICK SPECIMENS IN CEM AND STEM .1. CONTRAST [J].

CREWE, AV ;

GROVES, T .

[6]

DUPOUY G, 1962, J MICROSCOPIE, V1, P167

GENTSCH, P ;

GILDE, H ;

REIMER, L .

JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (JAN) :81-92

[8]

GOODMAN JW, 1968, INTRO FOURIER OPTICS, pCH6

[9]

HASHIMOTO H, 1966, P AMU ANL WORKSHOP H, P68

[10] THE DIELECTRIC THEORY OF ELECTRONIC INTERACTIONS IN SOLIDS [J].

HUBBARD, J .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1955, 68 (11) :976-986