THICK SPECIMENS IN CEM AND STEM - RESOLUTION AND IMAGE-FORMATION

被引：38

作者：

GROVES, T

机构：

[1] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637

[2] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

关键词：

D O I：

10.1016/S0304-3991(75)80005-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：15 / 31

页数：17

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[8]

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