ABSORPTION OF INFRARED RADIATION BY ELECTRONS IN SEMICONDUCTOR INVERSION LAYERS

被引：275

作者：

ALLEN, SJ

TSUI, DC

VINTER, B

机构：

[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA

[2] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

SOLID STATE COMMUNICATIONS | 1976年 / 20卷 / 04期

关键词：

D O I：

10.1016/0038-1098(76)90541-X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：425 / 428

页数：4

共 18 条

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[6]

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[7] RESONANCE SPECTROSCOPY OF ELECTRONIC LEVELS IN A SURFACE ACCUMULATION LAYER [J].

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[8]

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[9]

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[10]

KNESCHAUREK P, TO BE PUBLISHED

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