RESONANT CAVITIES FOR MEASURING THE SURFACE-RESISTANCE OF METALS AT X-BAND FREQUENCIES

被引:17
作者
HERNANDEZ, A
MARTIN, E
MARGINEDA, J
ZAMARRO, JM
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1986年 / 19卷 / 03期
关键词
D O I
10.1088/0022-3735/19/3/013
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:222 / 225
页数:4
相关论文
共 16 条
[1]   EFFECT OF DEGENERATE E11NU MODE IN H01NU MODE CAVITY ON MEASUREMENT OF COMPLEX PERMITTIVITY [J].
ARON, CP .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1967, 114 (08) :1030-&
[2]   GENERAL TE011-MODE WAVEGUIDE BANDPASS-FILTERS [J].
ATIA, AE ;
WILLIAMS, AE .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (10) :640-648
[3]  
Benson F., 1963, RECTANGULAR WAVEGUID, P1008
[4]  
BUSSEY HE, 1960, Q IRE T INSTRUM, V9, P171
[5]   MEASUREMENT OF SURFACE-RESISTANCE IN OVERSIZED CIRCULAR WAVEGUIDE AT MILLIMETER WAVELENGTHS [J].
HATANO, S ;
NIHEI, F .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (11) :886-887
[6]  
HERNANDEZ A, 1983, THESIS U MURCIA SPAI
[7]  
LENDING RD, 1955, P NAT ELECTRON C, P391
[8]   AUTOMATIC-MEASUREMENT OF Q-FACTOR AND RESONANT-FREQUENCY OF MICROWAVE RESONATORS [J].
MARTIN, E ;
HERNANDEZ, A ;
SANCHEZ, MC ;
ZAMARRO, JM ;
MARGINEDA, J .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (08) :961-962
[9]   EFFECT OF SURFACE ROUGHNESS ON EDDY CURRENT LOSSES AT MICROWAVE FREQUENCIES [J].
MORGAN, SP .
JOURNAL OF APPLIED PHYSICS, 1949, 20 (04) :352-362
[10]  
Ramo S., 2008, FIELDS WAVES COMMUNI