A SIMULTANEOUS STUDY OF LATTICE EXPANSION AND SWELLING IN PROTON-BOMBARDED GAP SINGLE-CRYSTALS

被引：4

作者：

ASCHERON, C ^{[1
]}

SCHINDLER, A ^{[1
]}

GEIST, V ^{[1
]}

OTTO, G ^{[1
]}

机构：

[1] AKAD WISSENSCH DDR,ZENT INST ISOTOPEN & STRAHLENFORSCH,LEIPZIG,GER DEM REP

来源：

RADIATION EFFECTS LETTERS | 1983年 / 68卷 / 05期

关键词：

D O I：

10.1080/01422448308226424

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：149 / 153

页数：5

共 21 条

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[2]

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[6]

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ULLRICH, HJ ;

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[8] X-RAY STUDY OF LATERAL STRAINS IN ION-IMPLANTED SILICON [J].

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[9] DETERMINATION OF LATTICE STRAIN IN PROTON-BOMBARDED REGIONS OF SINGLE-CRYSTAL GALLIUM-ARSENIDE, USING PRECISION X-RAY MEASUREMENTS [J].

HALLIWELL, MAG ;

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[10] ANNEALING BEHAVIOR OF STRESS IN SB-IMPLANTED SI [J].

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