ORIGIN OF FRINGE STRUCTURE OBSERVED IN HIGH-RESOLUTION BRIGHT-FIELD ELECTRON-MICROGRAPHS OF AMORPHOUS MATERIALS

被引：46

作者：

KRAKOW, W

AST, DG

GOLDFARB, W

SIEGEL, BM

机构：

[1] CORNELL UNIV,DEPT APPL & ENGN PHYS,ITHACA,NY 14853

[2] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853

[3] XEROX CORP,ROCHESTER,NY 14644

来源：

PHILOSOPHICAL MAGAZINE | 1976年 / 33卷 / 06期

关键词：

D O I：

10.1080/14786437608221929

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：985 / 1014

页数：30

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CHARBNAU, HP ;

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[5]

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PHYSICAL REVIEW B, 1973, 8 (02) :623-629

[8]

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[9]

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[10]

CURTIS GH, 1971, REV SCI INSTRUM, V42, P630

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