LASER DAMAGE ROUND-ROBIN TESTING (1.06-MU-M) WITH 13-NSEC PULSE DURATION AND 40-MU-M SPOT SIZE

被引:8
作者
SEITEL, SC
PORTEUS, JO
机构
来源
APPLIED OPTICS | 1984年 / 23卷 / 21期
关键词
D O I
10.1364/AO.23.003767
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:3767 / 3773
页数:7
相关论文
共 12 条
[1]  
Bettis J. R., 1976, NBS SPEC PUBL, V462, P338
[2]  
DESHAZER LG, 1973, NBS SPEC PUBL, V387, P114
[3]  
Foltyn S.R., 1984, NBS US SPEC PUBL, V669, P368
[4]   1.06-MU-M LASER DAMAGE OF THIN-FILM OPTICAL COATINGS - A ROUND-ROBIN EXPERIMENT INVOLVING VARIOUS PULSE LENGTHS AND BEAM DIAMETERS [J].
GUENTHER, KH ;
HUMPHERYS, TW ;
BALMER, J ;
BETTIS, JR ;
CASPARIS, E ;
EBERT, J ;
EICHNER, M ;
GUENTHER, AH ;
KIESEL, E ;
KUEHNEL, R ;
MILAM, D ;
RYSECK, W ;
SEITEL, SC ;
STEWART, AF ;
WEBER, H ;
WEBER, HP ;
WIRTENSON, GR ;
WOOD, RM .
APPLIED OPTICS, 1984, 23 (21) :3743-3752
[5]   1.06-MU-M LASER DAMAGE OF OPTICAL COATINGS - REGRESSION-ANALYSES OF ROUND-ROBIN TEST-RESULTS [J].
GUENTHER, KH ;
MENNINGEN, RG .
APPLIED OPTICS, 1984, 23 (21) :3754-3758
[6]  
Milam D., 1974, NBS US SPEC PUBL, V414, P169
[7]   PULSED LASER-INDUCED MELTING OF PRECISION DIAMOND-MACHINED CU, AG, AND AU AT INFRARED WAVELENGTHS [J].
PORTEUS, JO ;
DECKER, DL ;
FAITH, WN ;
GRANDJEAN, DJ ;
SEITEL, SC ;
SOILEAU, MJ .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1981, 17 (10) :2078-2085
[8]   ABSOLUTE ONSET OF OPTICAL-SURFACE DAMAGE USING DISTRIBUTED DEFECT ENSEMBLES [J].
PORTEUS, JO ;
SEITEL, SC .
APPLIED OPTICS, 1984, 23 (21) :3796-3805
[9]  
PORTEUS JO, 1977, NBS SPEC PUBL, V509, P507
[10]  
PORTEUS JO, 1982, UNPUB NOV P HIGH POW