HIGH-RESOLUTION ELECTRON-MICROSCOPIC STUDIES OF STRUCTURAL FAULTS IN LAYERED SILICATES

被引：14

作者：

JEFFERSON, DA ^{[1
]}

THOMAS, JM ^{[1
]}

机构：

[1] UNIV COLL WALES, EDWARD DAVIES CHEM LABS, ABERYSTWYTH SY23 1NE, WALES

来源：

JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II | 1974年 / 70卷 / 10期

关键词：

D O I：

10.1039/f29747001691

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：1691 / +

页数：1

共 30 条

[1] CRYSTALLOGRAPHIC SHEAR IN WO3.XNB2O5 (X=0.03-0.09) [J].

ALLPRESS, JG .

JOURNAL OF SOLID STATE CHEMISTRY, 1972, 4 (02) :173-&

[2] DIRECT OBSERVATION OF STRUCTURE OF REAL CRYSTALS BY LATTICE IMAGING [J].

ALLPRESS, JG ;

SANDERS, JV .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (JUN1) :165-190

[3] STRUCTURAL STUDIES BY ELECTRON-MICROSCOPY - HIGH-RESOLUTION OBSERVATIONS ON BETA-ZRO2 12NB2O5 [J].

ALLPRESS, JG ;

IIJIMA, S ;

ROTH, RS ;

STEPHENSON, NC .

JOURNAL OF SOLID STATE CHEMISTRY, 1973, 7 (01) :89-93

[4]

Amelinckx S., 1964, DIRECT OBSERVATION D

[5]

Anderson J. S., 1974, SURFACE DEFECT PROPE, V3, P1

[6]

Bragg W.L., 1965, CRYSTAL STRUCTURE MI, VVolume 4

[7] CHLORITE EXAMINATION BY ULTRAMICROTOMY AND HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

BROWN, JL ;

JACKSON, ML .

CLAYS AND CLAY MINERALS, 1973, 21 (01) :1-7

[8]

BURSILL LA, 1972, PROGR SOLID STATE CH, V7

[9] STUDY OF RELATIONSHIP BETWEEN LATTICE FRINGES AND LATTICE PLANES IN ELECTRON MICROSCOPE IMAGES OF CRYSTALS CONTAINING DEFECTS [J].

COCKAYNE, DJ ;

PARSONS, JR ;

HOELKE, CW .

PHILOSOPHICAL MAGAZINE, 1971, 24 (187) :139-&

[10] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS [J].

COWLEY, JM ;

IIJMA, S .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03) :445-+

← 1 2 3 →