ION-BEAM ANGLE DEPENDENCE OF COLLISIONALLY EXCITED AUGER-ELECTRON EMISSION FROM AL AND SI SURFACES

被引：3

作者：

ANDREADIS, TD ^{[1
]}

FINE, J ^{[1
]}

MATTHEW, JAD ^{[1
]}

机构：

[1] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.571885

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1159 / 1160

页数：2

共 7 条

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[6] ION-INDUCED AUGER-ELECTRON EMISSION OF MG, AL AND SI AS A FUNCTION OF ION ENERGY [J].

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[7] NONRELATIVISTIC AUGER RATES, X-RAY RATES, AND FLUORESCENCE YIELDS FOOR 2P SHELL [J].

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