ATOMIC-STRUCTURE AND ELECTRONIC-STRUCTURE STUDY ON THE LAYERS OF 4HB-TAS2 PREPARED BY A LAYER-BY-LAYER ETCHING TECHNIQUE

被引:11
作者
KIM, JJ [1 ]
OLIN, H [1 ]
机构
[1] GOTHENBURG UNIV,S-41296 GOTHENBURG,SWEDEN
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 20期
关键词
D O I
10.1103/PhysRevB.52.R14388
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have studied the atomic and electronic structures of 4Hb-TaS2, which has alternating layers of the 1T and 1H type, at room temperature and 77 K, using a scanning tunneling microscope. Using a layer-by-layer etching technique, we fabricated staircases with alternating layers of the 1T and 1H type. The T-type layers showed the typical root 13 X root 13 charge-density-wave structures, whereas the H-type layers had the triangular atomic structure at both temperatures. The measured tunneling spectra of each layer at 77 K showed entirely different characteristics; the 1H layer remained in the metallic state, whereas the 1T layer showed an insulating behavior with a wide opening of the energy gap at the Fermi level at 77 K.
引用
收藏
页码:14388 / 14391
页数:4
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