CONTROLLED FOCUSING AND STIGMATING IN CONVENTIONAL AND SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：16

作者：

FRANK, J ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,FREE SCH LANE,CAMBRIDGE CB2 3RQ,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1975年 / 8卷 / 07期

关键词：

D O I：

10.1088/0022-3735/8/7/014

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：582 / 587

页数：6

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TEMPLE, JA .

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[10] NEW ALGORITHM FOR COMPUTING CORRELATIONS [J].

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