WHY IN-SITU, REAL-TIME CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES

被引:6
作者
AUCIELLO, O
KRAUSS, AR
机构
[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439
[2] ARGONNE NATL LAB,DIV CHEM,ARGONNE,IL 60439
关键词
D O I
10.1557/S0883769400044833
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
[No abstract available]
引用
收藏
页码:14 / 15
页数:2
相关论文
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