PROCESSOR-CONTROLLED MICRODENSITOMETRY

被引：7

作者：

EWBANK, JD

BOWERS, P

PINEGAR, J

SCHAFER, L

机构：

来源：

APPLIED SPECTROSCOPY | 1981年 / 35卷 / 06期

关键词：

D O I：

10.1366/0003702814732120

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：540 / 543

页数：4

共 9 条

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CARROLL, BL .

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[2]

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[3] SIMPLE PAPER TAPE-TO-CARD PUNCH DATA CONVERTING UNIT [J].

EWBANK, JD ;

BENSTON, OJ ;

MCELVEEN, KH ;

SCHAFER, L .

APPLIED SPECTROSCOPY, 1975, 29 (01) :77-77

[4] EVALUATION OF KODAK ELECTRON IMAGE PLATES FOR ACCURATE EXPOSURE MEASUREMENTS IN ELECTRON DIFFRACTION [J].

FOSTER, HR .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (13) :5344-&

[5] PRECISION DENSITOMETER FOR GASEOUS ELECTRON-DIFFRACTION [J].

FOSTER, HR ;

BONHAM, RA ;

WILLIAMS, ML ;

KOHL, DA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (04) :605-&

[6] AN IMPROVED MICROPHOTOMETER TRACE OF RADIALLY SYMMETRIC PATTERNS [J].

KARLE, IL ;

HOOBER, D ;

KARLE, J .

JOURNAL OF CHEMICAL PHYSICS, 1947, 15 (10) :765-765

[7] MEASUREMENT OF ELECTRON-DIFFRACTION INTENSITY BY A DIGITAL VOLTMETER [J].

MORINO, Y ;

KUCHITSU, K ;

FUKUYAMA, T .

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1967, 40 (02) :423-+

[8]

SCHAFER L, 1976, APPL SPECTROSC, V30, P113

[9]

WISMAN JA, UNPUBLISHED

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