ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES

被引：232

作者：

MARTI, O

DRAKE, B

HANSMA, PK

机构：

来源：

关键词：

D O I：

10.1063/1.98374

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：484 / 486

页数：3

共 18 条

[1] ANDERSON HL, 1981, AIP 50 ANNIVERSARY P, P41
[2] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[3] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[4] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
BINNIG, G
SMITH, DPE
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1688 - 1689
[5] BINNIG G, 1987, EUROPHYS LETT, V3
[6] BINNIG G, 1986, IBM J RES DEV, V30, P3555
[7] INTERACTION BETWEEN A HE ATOM AND A GRAPHITE SURFACE
CARLOS, WE
COLE, MW
[J]. SURFACE SCIENCE, 1980, 91 (01) : 339 - 357
[8] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY
DURIG, U
GIMZEWSKI, JK
POHL, DW
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406
[9] GUNTHER KH, 1984, APPL OPTICS, V23, P3820
[10] SCANNING TUNNELING MICROSCOPY
HANSMA, PK
TERSOFF, J
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : R1 - R23