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SUBMICROMETER THIN GATE OXIDE P-CHANNEL TRANSISTORS WITH P+ POLYSILICON GATES FOR VLSI APPLICATIONS
被引:9
作者
:
CHAM, KM
论文数:
0
引用数:
0
h-index:
0
CHAM, KM
WENOCUR, DW
论文数:
0
引用数:
0
h-index:
0
WENOCUR, DW
LIN, J
论文数:
0
引用数:
0
h-index:
0
LIN, J
LAU, CK
论文数:
0
引用数:
0
h-index:
0
LAU, CK
FU, HS
论文数:
0
引用数:
0
h-index:
0
FU, HS
机构
:
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1986年
/ 7卷
/ 01期
关键词
:
D O I
:
10.1109/EDL.1986.26288
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:49 / 52
页数:4
相关论文
共 5 条
[1]
DEVICE DESIGN FOR THE SUBMICROMETER P-CHANNEL FET WITH N+ POLYSILICON GATE
CHAM, KM
论文数:
0
引用数:
0
h-index:
0
CHAM, KM
CHIANG, SY
论文数:
0
引用数:
0
h-index:
0
CHIANG, SY
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(07)
: 964
-
968
[2]
NONPLANAR VLSI DEVICE ANALYSIS USING THE SOLUTION OF POISSON EQUATION
GREENFIELD, JA
论文数:
0
引用数:
0
h-index:
0
GREENFIELD, JA
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
DUTTON, RW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1520
-
1532
[3]
MURAO Y, 1983 IEDM, P518
[4]
PARRILLO LC, 1984 IEDM, P418
[5]
VLSI LIMITATIONS FROM DRAIN-INDUCED BARRIER LOWERING
TROUTMAN, RR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Division, Essex Junction
TROUTMAN, RR
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
: 383
-
391
←
1
→
共 5 条
[1]
DEVICE DESIGN FOR THE SUBMICROMETER P-CHANNEL FET WITH N+ POLYSILICON GATE
CHAM, KM
论文数:
0
引用数:
0
h-index:
0
CHAM, KM
CHIANG, SY
论文数:
0
引用数:
0
h-index:
0
CHIANG, SY
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(07)
: 964
-
968
[2]
NONPLANAR VLSI DEVICE ANALYSIS USING THE SOLUTION OF POISSON EQUATION
GREENFIELD, JA
论文数:
0
引用数:
0
h-index:
0
GREENFIELD, JA
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
DUTTON, RW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1520
-
1532
[3]
MURAO Y, 1983 IEDM, P518
[4]
PARRILLO LC, 1984 IEDM, P418
[5]
VLSI LIMITATIONS FROM DRAIN-INDUCED BARRIER LOWERING
TROUTMAN, RR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Division, Essex Junction
TROUTMAN, RR
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
: 383
-
391
←
1
→