SIMULTANEOUS WAVELENGTH COMPARISON OF IODINE-STABILIZED LASERS AT 515-NM, 633-NM, AND 640-NM

[1] BONSCH G, 1983, APPL OPTICS, V22, P3414, DOI 10.1364/AO.22.003414

[2] EFFECT OF DIFFRACTION ON INTERFERENTIAL LENGTH MEASUREMENTS [J]. METROLOGIA, 1976, 12 (02) : 57 - 60

[3] LOSS ANALYSIS OF SINGLE-MODE FIBER SPLICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1977, 56 (05): : 703 - 718

[4] FREQUENCY STABILIZATION OF AR-+ LASERS AT 582-THZ USING EXPANDED BEAMS IN EXTERNAL I-127(2) CELLS [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (04) : 361 - 363

[5] INFLUENCE OF SMALL IMPURITIES IN ABSORPTION CELLS OF I-2 STABILIZED LASERS UPON THEIR FREQUENCY [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 246 - 248

[6] BEAM-TO-FIBER COUPLING WITH LOW STANDING WAVE RATIO [J]. APPLIED OPTICS, 1980, 19 (14): : 2453 - 2456

[7] ZHAO ZG, 1985, IEEE INSTR, V34, P252

[8] 1984, METROLOGIA, V19, P163

[1] BONSCH G, 1983, APPL OPTICS, V22, P3414, DOI 10.1364/AO.22.003414

[2] EFFECT OF DIFFRACTION ON INTERFERENTIAL LENGTH MEASUREMENTS [J]. METROLOGIA, 1976, 12 (02) : 57 - 60

[3] LOSS ANALYSIS OF SINGLE-MODE FIBER SPLICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1977, 56 (05): : 703 - 718

[4] FREQUENCY STABILIZATION OF AR-+ LASERS AT 582-THZ USING EXPANDED BEAMS IN EXTERNAL I-127(2) CELLS [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1980, 29 (04) : 361 - 363

[5] INFLUENCE OF SMALL IMPURITIES IN ABSORPTION CELLS OF I-2 STABILIZED LASERS UPON THEIR FREQUENCY [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) : 246 - 248

[6] BEAM-TO-FIBER COUPLING WITH LOW STANDING WAVE RATIO [J]. APPLIED OPTICS, 1980, 19 (14): : 2453 - 2456

[7] ZHAO ZG, 1985, IEEE INSTR, V34, P252

[8] 1984, METROLOGIA, V19, P163