SIMULTANEOUS INVESTIGATION OF CRYSTAL-STRUCTURE AND ELECTRICAL PROPERTIES OF CRYSTALLIZED GERMANIUM FILMS BY UHV INSITU ELECTRON-MICROSCOPY

被引：13

作者：

BARNA, A ^{[1
]}

BARNA, PB ^{[1
]}

BODO, Z ^{[1
]}

POCZA, JF ^{[1
]}

POZSGAI, I ^{[1
]}

RADNOCZI, G ^{[1
]}

机构：

[1] HUNGARIAN ACAD PHYS,RES INST TECH PHYS,BUDAPEST,HUNGARY

来源：

关键词：

D O I：

10.1016/0040-6090(74)90216-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：49 / 62

页数：14

共 19 条

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ANDERSON, JC
[J]. ADVANCES IN PHYSICS, 1970, 19 (79) : 311 - &
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[4] BARNA A, 1972, JUGOSLAV KOMITET VAK, V12, P181
[5] BIENENSTOCK AI, 1973, 5 P INT C AM LIQ SEM
[6] Ehrenreich H., 1970, Comments on Solid State Physics, V3, P75
[7] Fritzsche H., 1971, Journal of Non-Crystalline Solids, V6, P49, DOI 10.1016/0022-3093(71)90015-9
[8] JOHANESSEN JS, 1972, AE140 ELAB REP
[9] THICKNESS DEPENDENCE OF HOPPING TRANSPORT IN AMORPHOUS-GE FILMS
KNOTEK, ML
POLLAK, M
DONOVAN, TM
KURTZMAN, H
[J]. PHYSICAL REVIEW LETTERS, 1973, 30 (18) : 853 - 856
[10] Moss S. C., 1973, Comments on Solid State Physics, V5, P47