X-RAY EXTINCTION CONTRAST TOPOGRAPHY OF SILICON STRAINED BY THIN SURFACE FILMS

[1] [Anonymous], INSTRUCTION MANUAL

[2] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &

[3] BLECH IA, TO BE PUBLISHED

[4] Bonse U., 1962, DIRECT OBSERVATION I, P431

[5] *DIE ABSORPTION VON RONTGENSTRAHLEN IM FALL DER INTERFERENZ [J]. ZEITSCHRIFT FUR PHYSIK, 1950, 127 (04): : 297 - 323

[6] HIRSCH PB, 1960, 4 INT C EL MICR, P527

[7] Jenkinson A. E., 1962, DIRECT OBSERVATION I, P471

[8] LANG AR, 1959, J APPL PHYSICS, V30, P748

[9] MEIERAN ES, 1965, ADVANCES XRAY ANALYS, V8, P48

[10] NEWKIRK JB, 1959, T AM I MIN MET ENG, V215, P483

[1] [Anonymous], INSTRUCTION MANUAL

[2] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &

[3] BLECH IA, TO BE PUBLISHED

[4] Bonse U., 1962, DIRECT OBSERVATION I, P431

[5] *DIE ABSORPTION VON RONTGENSTRAHLEN IM FALL DER INTERFERENZ [J]. ZEITSCHRIFT FUR PHYSIK, 1950, 127 (04): : 297 - 323

[6] HIRSCH PB, 1960, 4 INT C EL MICR, P527

[7] Jenkinson A. E., 1962, DIRECT OBSERVATION I, P471

[8] LANG AR, 1959, J APPL PHYSICS, V30, P748

[9] MEIERAN ES, 1965, ADVANCES XRAY ANALYS, V8, P48

[10] NEWKIRK JB, 1959, T AM I MIN MET ENG, V215, P483